High-precision Contour Measurement

Contour Meter

Brand: BRUKER

Model: Contour GTK

Function: Use non-contact surface measurement technology to measure surface roughness, providing vertical range measurement from angstrom to millimeter in a large field of view; vertical resolution is better than 0.01nm, Z-direction scanning range is 0.1nm to 10mm, RMS repeatability is 0.01nm.

Atomic Force Microscope

Brand: BRUKER

Model: Dimension EDGE

Function: Bruker atomic force microscope Dimension Edge uses DimensionIcon® system to reduce the closed-loop positioning noise level to the length range of a single chemical bond;

Vertical measurement range 0-10mm;

Vertical resolution <0.1nm;

RMS measurement repeatability ≤0.01nm

The surface information of the lens plays an important role in film surface analysis. The use of non-contact profilometer and atomic force microscope can meet the measurement of lens surface information. It can realize the measurement of parameters such as surface roughness, abnormal surface defects, and small-sized steps.